Nova (NASDAQ:NVMI) Announces Earnings Results

Nova (NASDAQ:NVMI) issued its quarterly earnings results on Thursday. The semiconductor company reported $1.78 EPS for the quarter, missing analysts’ consensus estimates of $1.82 by ($0.04), Zacks reports. Nova had a return on equity of 21.35% and a net margin of 28.00%. Nova updated its Q1 2025 guidance to 2.000-2.160 EPS.

Nova Trading Down 1.3 %

Shares of NVMI stock traded down $3.51 on Friday, reaching $265.50. 17,905 shares of the company’s stock were exchanged, compared to its average volume of 227,871. Nova has a 52 week low of $154.54 and a 52 week high of $289.90. The stock has a market capitalization of $7.71 billion, a PE ratio of 49.62, a P/E/G ratio of 2.07 and a beta of 1.44. The company’s fifty day simple moving average is $219.90 and its 200 day simple moving average is $206.68.

Analysts Set New Price Targets

Several analysts recently issued reports on NVMI shares. Citigroup upgraded Nova from a “neutral” rating to a “buy” rating and increased their target price for the stock from $226.00 to $240.00 in a research report on Monday, January 6th. Benchmark increased their price target on Nova from $240.00 to $245.00 and gave the company a “buy” rating in a research note on Friday, November 8th. Cantor Fitzgerald started coverage on Nova in a research note on Monday, January 13th. They set an “overweight” rating and a $275.00 price target for the company. Finally, Needham & Company LLC reaffirmed a “hold” rating on shares of Nova in a research note on Friday. One analyst has rated the stock with a hold rating and six have assigned a buy rating to the stock. Based on data from MarketBeat, the stock presently has a consensus rating of “Moderate Buy” and a consensus price target of $238.33.

Nova Company Profile

Nova Ltd. designs, develops, produces, and sells process control systems used in the manufacture of semiconductors in Israel, Taiwan, the United States, China, Korea, and internationally. Its product portfolio includes a set of metrology platforms for dimensional, films, and materials and chemical metrology measurements for process control for various semiconductor manufacturing process steps, including lithography, etch, chemical mechanical planarization, deposition, electrochemical plating, and advanced packaging.